VLSI Test Technology & Reliabillity
Delft University of TechnologyNetherlands
Free, no sign-up neededArchived courseEnglish
About this course
This course is an introduction to the field of digital systems testing, which is an integral part of IC design and manufacturing. The topics discussed are: Importance of VLSI Testing, Test process and Automatic Test Equipment, Defects versus Fault models, Fault simulation, Logic simulation, Combinational Circuit Testing, Sequential Circuit Testing, Memory Testing, Design-for-Testability, Scan Design, Boundary Scan, Built-in-Self Test, Delay Test, Current Testing, VLSI Reliability, etc.
Description from TU Delft OpenCourseWare.
Where to take this course
- Open TU Delft OpenCourseWare (new tab)TU Delft OpenCourseWare · Archived course